SmartMore Efficient Vision Inspection System for Silicon Wafer

Industry: Manufacturing/Quality Inspection
Products: Industrial Camera, FA Lens and Custom Lights, IPC
Software: SmartMore Vimo Industrial Inspection Platform; Silicon Wafer Defect Detection SDK

Chipsets are typically designed to work with a specific series of microprocessors because it regulates the communication between the processor and the external devices. It plays a vital role in determining system performance. In the chip production process, wafer bumps critical chip components need to be uniform in height to facilitate subsequent manufacturing steps. The height unevenness in a bump array affects wafer probing, flip-chip assembly and electronics board assembly.

Challenge

Limitations of Conventional Silicon Wafer Detection

The manufacturing process of silicon wafers is complex. Any minor defect can impact the whole production process. On a 12-inch wafer, two or more miscellaneous particles larger than 20nm are not allowed. Wafer manufacturing process optimization and productivity-improving have always been the unremitting pursuit of chip manufacturers. However, most companies utilize the traditional manual visual inspection. It is time-consuming, costly, and difficult to trace and identify flaws.

Solution

How SMore ViMo dramatically improves the accuracy of the mold and production efficiency

In response to the urgent production demand of enterprises, SmartMore, a machine vision company for industrial automation, took on this challenge and launched its powerful product - SMore ViMo, and developed a vision system that allows for manual and automation inspection operation, ensuring exact inspection of the wafer. Let's see how it works magically.

★[Preliminary Stage 1.0] The defects are located and identified for the same batch of silicon wafers produced in the same period through the defect detection system.
 
★[Upgrade Stage 2.0] After acquiring the collection of defect pictures, SMore ViMo can accurately capture the defect's batch, category, and location and generate an aggregated diagram for the defects according to set or date.
 
★[Ultimate Stage 3.0] By analyzing the schematic diagram of defect aggregation, SMore ViMo can identify process defects, use them as problem templates, and establish a mapping relationship with the statistical distribution of blemishes to help quickly identify the generation of defects and the cause of failure.

Besides this powerful industrial inspection platform, we also offer high-quality certified vision products, including industrial cameras, FA lenses, IPC and lights customized for clients, providing a complete solution for silicon wafer inspection.

Success Stories

★Client A: In a famous semiconductor company's sapphire LED wafer inspection project, one system can identify wafers of different specifications.
★Client B: In a semiconductor technology company's silicon wafer inspection project, the inspection efficiency is increased by 50%, and 100% inspection is achieved.
★Client C: In the silicon wafer detection project of a leading R&D enterprise of dynamic random access memory, the algorithm detection accuracy rate is 99.5%, significantly shortening the project cycle.
★Client D: In an electronic information enterprise's chips detection and counting project, the detection accuracy rate reaches 98.5%.

Conclusion

Advances such as precision vision inspection machines and modeling algorithms enable flexible and lean automated production systems for silicon wafer detection. Critical factors such as speed, accuracy, and repeatability of the measurements are addressed with industrial-grade and high-resolution camera technologies, empowering the vision system to get consistent results with high precision in a short time. Human operation is even minimized by having the operator simply place it on the machine and press a button. The system shows the results on the screen and records them later, allowing for repeated operation.